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NDT in China – from West to East.

Subjects: *COMMERCIAL product testing; *NONDESTRUCTIVE testing; *UNIVERSITIES & collegesCHINA; GREAT Britain

  • Source: Insight: Non-Destructive Testing & Condition Monitoring. Jun2005, Vol. 47 Issue 6, p366-367. 2p.

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Academic Journal

Self-formation of GaN hollow nanocolumns by inductively coupled plasma etching.

Subjects: *NANOSTRUCTURES; *GALLIUM nitride; *PLASMA etching

  • Source: Applied Physics A: Materials Science & Processing. May2005, Vol. 80 Issue 8, p1607-1610. 4p.

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  • 1-10 of  18 results for ""Gui, Y""